A team of researchers from the Department of Electrical & Computer Engineering at the National University of Singapore (NUS) Faculty of Engineering developed the new Magnetoresistive Random Access Memory (MRAM) technology that can boost information storage in electronic systems.
The technology will drastically increase storage space and enhance memory which will ensure that fresh data stays intact, even in the case of a power failure.
Led by Dr Yang Hyunsoo, the team developed a new device structure useful for the next generation MRAM chip which can potentially be applied to enhance the user experience in consumer electronics, including personal computers and mobile devices such as laptops and mobile phones.
"From the consumer's standpoint, we will no longer need to wait for our computers or laptops to boot up. Storage space will increase, and memory will be so enhanced that there is no need to regularly hit the 'save' button as fresh data will stay intact even in the case of a power failure," Yang said.
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"Devices and equipment can now have bigger memory with no loss for at least 20 years or probably more. Currently pursued schemes with a very thin magnetic layer can only retain information for about a year," Yang added.
The innovation is expected to change the architecture of computers, making them much easier to manufacture as it does away with many facilities such as flash memory, effectively bringing down the cost.
MRAM is emerging as the next big thing in data storage as it is non-volatile, which means that data can be retrieved even when the electronic equipment is not powered up.
The current methods of applying MRAM revolve round the technology which uses an 'in-plane', or horizontal, current-induced magnetisation.
The NUS team, in collaboration with the King Abdullah University of Science and Technology in Saudi Arabia, was able to resolve this problem by incorporating magnetic multilayer structures as thick as 20 nanometre, providing an alternative film structure for transmission of electronic data and storage.
The findings are published in the journal Physical Review Letters.